High voltage driver circuit with fast current limiting for testing of integrated circuits
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United States of America Patent
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Feb 20, 1996
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N/A
app pub date -
Aug 16, 1993
filing date -
Aug 16, 1993
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Abstract
A circuit that provides for digitally programmable high voltage drive, as well as fast current limiting capability for testing of integrated circuits. The circuit also provides for digitally programmable slew rate control for controlling the rise and fall times of an output voltage. Integrated circuits requiring low voltage and high voltage tests at different speeds and with different current limiting conditions, or low and high current forcing with different voltage clamp levels, or a mixture of the two can be tested in a single continuous test pattern using the circuit of the present invention.
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