Method of visualizing minute particles
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United States of America Patent
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Feb 27, 1996
Issued Date -
N/A
app pub date -
Jan 7, 1994
filing date -
Nov 6, 1991
priority date (Note) -
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Abstract
The visualization method includes generating a relatively wide beam of light directed onto an object to be inspected and determining the center of intensity of the wide beam of light reflected from the object for facilitating geometric dimensional calculations of a large number of such objects, such as solder deposits on the surface of a printed circuit board, in a very short period of time and in a very accurate manner.
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