Analog-digital mixed master including therein a test circuit
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United States of America Patent
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Apr 9, 1996
Issued Date -
N/A
app pub date -
Jun 5, 1995
filing date -
Mar 30, 1992
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
In an analog-digital mixed master for a Bi-CMOS analog/digital mixed LSI, an analog circuit and a digital circuit are interconnected through selectors, which are also connected to test terminals and which are controlled by test mode terminals. By changing the signals applied to the test mode terminals, the analog circuit and the digital circuit are interconnected through the selectors, or the analog circuit is connected through the selectors to the test terminals, or the digital circuit is connected through the selectors to the test terminals. Thus, the analog circuit and the digital circuit can be tested independently of each other.
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