X-ray inspection system and method

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United States of America Patent

PATENT NO 5506880
SERIAL NO

08357716

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An x-ray system and method capable of producing very accurate RTR images corrected for x-ray system inhomogeneities. A three-dimensional correction memory is used to store deviation information relating to system inhomogeneities. The three-dimensional correction memory is indexed by x and y coordinates of the image plane and an attenuation coordinate associated with a plurality of standard samples. The standard samples are exposed in turn, and deviations between the measured attenuation and the nominal attenuation are noted and stored at the x and y coordinates in the attenuation plane for the sample then exposed. The procedure is repeated for a plurality of samples to create a three-dimensional correction array. An object to be imaged creates a set of raw intensity information. The raw information is corrected by accessing the correction memory at the x and y coordinates of each pixel to be corrected and the attenuation coordinate associated with the raw measurement. The deviation information is applied to the raw measurement to produce and store a corrected attenuation factor for each pixel.

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Patent Owner(s)

Patent OwnerAddress
AUTOLIV ASP INC3350 AIRPORT ROAD OGDEN UT 84405

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Beaumont, Ringo C Bear River, UT 1 46
Scardino, Paul G Layton, UT 2 105

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