System and method for stable analysis of sampled transients arbitrarily aligned with their sample points
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United States of America Patent
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May 14, 1996
Grant Date -
N/A
app pub date -
May 5, 1993
filing date -
May 5, 1993
priority date (Note) -
Expired
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Abstract
A method of stably identifying and characterizing a transient contained in a sampled set of data, the data representing a physical event, where alignment of the sample points with the transient is typically arbitrary. The method includes the step of analyzing the first data set using a predefined mathematical operator to produce a second data set, detecting and isolating the discrete data pattern in the second data set, determining a location of the detected and isolated data pattern in the second data set, measuring a difference between the location of the detected and isolated data pattern and a predetermined location of the predefined mathematical operator, adjusting preselected parameters of the mathematical operator in accordance with the measured location difference such that the adjusted mathematical operator is aligned with the detected and isolated data pattern, and reanalyzing the first data set using the aligned mathematical operator.
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