Method for measuring internal information in scattering medium and apparatus for the same

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United States of America Patent

PATENT NO 5517987
SERIAL NO

08252227

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Abstract

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A method of measuring internal information in a scattering medium, and an apparatus for the same of the present invention measure internal information in the scattering medium by measuring light diffused during propagation in the scattering medium while receiving the influence of the scattering and absorption, and performing arithmetic processing to the measured values. At this time, the three or more kinds of the detected signals (measured values) measured at three or more different kinds of distances between the light incident position and the photodetection point are processed by utilizing dependencies of the behavior of light diffused during propagation in the scattering medium and the resulting signal, that is, a photodetection signal on characteristics such as a scattering constituent, or an absorption constituent in the scattering medium and the concentration. The measured internal information is the absolute value of a scattering coefficient or a transport scattering coefficient of the scattering medium, and the information associated with a specified scattering constituent or a specified absorption constituent can be measured by processing the measured internal information.

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Patent Owner(s)

  • HAMAMATSU PHOTONICS K.K.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Tsuchiya, Yutaka Hamamatsu, JP 142 2654

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