Probe card apparatus
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
May 28, 1996
Issued Date -
N/A
app pub date -
Oct 15, 1991
filing date -
Sep 20, 1990
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Probe card apparatus includes a base element having a central cutout portion and an insert block is disposed in the cut out portion. A probe card secured to the base element includes a plurality of needle elements which contact electrical elements on an integrated circuit chip on a wafer being tested. The base element and probe card are secured to a printed circuit board. The insert contacts the needle elements and biases them against the electrical elements being tested. The insert block is positionable relative to the base element and to the needle elements, and the base element is positionable relative to the printed circuit board.
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