Importance

Loading Importance Indicators...

Abstract

A method and apparatus for testing semiconductor devices at device operating speed for both proper combinational and timing logic functions with a standard low speed logic tester. A high speed phase-lock-loop system clock of the semiconductor device is frequency and phase locked to the lower speed logic tester clock. Test data is shifted into the semiconductor device at the test clock speed. Two controlled system clock pulses are utilized to clock the test data into the semiconductor devices. The first of these two pulses starts the test and the second ends the test. In this way, the combinational functions of the semiconductor devices are tested at the system operating speed.

Loading the Abstract Image...

First Claim