Wafer method for breaking a semiconductor

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United States of America Patent

PATENT NO 5527744
SERIAL NO

08342988

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Abstract

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A process for partially sawing the streets on semiconductor wafers. After sawing the streets can be covered by a protective material, and then the wafer continues its processing as before. After the wafer is broken, the protective material may or may not be removed. Additionally, the wafer may be broken into individual chips using a wedge piece that has a number of individual wedges on it, where the individual wedges press against the partially sawn streets, causing the wafer to break.

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Patent Owner(s)

Patent OwnerAddress
TEXAS INSTRUMENTS INCORPORATEDP O BOX 655474 MAIL STATION 3999 DALLAS TX 75265-5474 75265-5474

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Alfaro, Rafael C Carrollton, TX 12 454
Mignardi, Michael A Dallas, TX 13 1006

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