Method for measuring scattering medium and apparatus for the same

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United States of America Patent

PATENT NO 5529065
SERIAL NO

08251969

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Abstract

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A method of measuring internal information in a scattering medium and an apparatus for the same of the present invention measure internal information in the scattering medium by measuring light diffused during propagation in the scattering medium at outside of the scattering medium while receiving the influence of the scattering and absorption, and performing arithmetic processing to the measured values. At this time, the three or more kinds of the detected signals (measured values) detected at a plurality of distances between the light incident position and the photodetection point for the light having a plurality of predetermined wavelengths are processed by utilizing dependencies of the behavior of light diffused during propagation in the scattering medium and the resulting signal, i.e., a photodetection signal on characteristics such as a scattering constituent, or an absorption constituent in the scattering medium and their concentration. If the measurement is performed at a plurality of wavelenghts on an object to be measured, a ratio of absorption coefficients and a ratio of concentrations of specified absorptive constituents in scattering medium can be measured.

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Patent Owner(s)

Patent OwnerAddress
HAMAMATSU PHOTONICS K K1126-1 ICHINO-CHO HIGASHI-KU HAMAMATSU-SHI SHIZUOKA 435-8558

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Tsuchiya, Yutaka Hamamatsu, JP 142 2654

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