Apparatus and method for evaluating orientation film

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United States of America Patent

PATENT NO 5532488
SERIAL NO

08305905

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An orientation film evaluating apparatus and a rubbing processing apparatus by which the orientation capability for a liquid crystal orientation film can be measured quantitatively with high sensitivity and accuracy even during an actual production process, and an orientation condition is controlled precisely so as to obtain a stable production condition and to improve productivity and yield therefor. The orientation film evaluating apparatus includes: a unit for radiating infrared light; a polarizing portion which polarizes the infrared at varied angles to an orientation film, and for irradiating the polarized infrared lights to the orientation film; a detection portion which detects infrared light reflected upon the orientation film; and an evaluating portion which obtains a difference of absorbance of infrared light detected by the detection portion with respect to a polarized direction of the orientation film, and which evaluates an orientation capability of the orientation film.

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Patent Owner(s)

Patent OwnerAddress
KABUSHIKI KAISHA TOSHIBA72-34 HORIKAWA-CHO SAIWAI-KU KAWASAKI-SHI KANAGAWA 2120013 ?2120013

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hasegawa, Rei Kanagawa-ken, JP 101 1060
Ishibashi, Mitsuru Chiba-ken, JP 30 218
Nomaki, Tatsuo Kanagawa-ken, JP 4 69
Sasaki, Hideyuki Kanagawa-ken, JP 31 185
Tanaka, Akira Kanagawa-ken, JP 543 6826

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