Apparatus and method for monitoring radiation effects at different intensities
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United States of America Patent
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Jul 9, 1996
Issued Date -
N/A
app pub date -
May 15, 1995
filing date -
Apr 2, 1992
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A multi-channel electromagnetically transparent voltage probe transmission link system or method monitors a plurality of voltage signals at a plurality of test points of a device under test that is subject to a radiation field with at least two intensity levels. The system or method compares the monitored voltage signals at the first intensity level corresponding to the level at which the monitored voltage signals not being affected by the radiation field, and the second intensity level being greater than the first intensity level. The system or methods determines whether or not the device is affected by the radiation field by determining if the monitored voltage signals are affected by the radiation field at the second intensity level.
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