Method and apparatus for analyzing finite state machines

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United States of America Patent

PATENT NO 5539680
SERIAL NO

08285932

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Abstract

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A computer system for generating a summary of test coverage for a hardware description. The hardware description corresponds to a finite state machine (FSM). This embodiment requires at least one test vector. The computer system comprises a memory and a processor. The memory is for storing the hardware description and the test vector. The processor, coupled to the memory, uses the hardware description and generates state information corresponding to the FSM. The processor, using the state information, further generates a first description. The first description includes a description for monitoring states and signals in the hardware description. The processor, using the test vector, the hardware description and the first description, further generates the test coverage summary.

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Patent Owner(s)

Patent OwnerAddress
SUN MICROSYSTEMS INC2550 GARCIA AVE MOUNTAIN VIEW CA 94043

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chang, Chee-Keng Mountain View, CA 1 28
Kuang, Ser-Hou San Jose, CA 3 93
Maturana, Guillermo Berkeley, CA 8 218
Palnitkar, Samir S Sunnyvale, CA 2 46
Saggurti, Prasad V Sunnyvale, CA 1 28

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