US Patent No: 5,539,692

Number of patents in Portfolio can not be more than 2000

Semiconductor memory and method of setting type

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Abstract

A semiconductor chip is provided with a function selection circuit for selecting memory functions according to the information stored in nonvolatile memory elements is sealed in a package, and the memory functions are set finally by writing the nonvolatile memory element in that state or in a state in which the semiconductor chip is mounted on a board. By setting the type of a semiconductor memory according to the above procedure, the process from the wafer process up to the assembling step can be made common, and hence the mass-productibity and the production control can be facilitated. Semiconductor memories having memory functions conforming to user specifications can be provided in a short time.

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First Claim

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Patent Owner(s)

Patent OwnerAddressTotal Patents
ELPIDA MEMORY, INC.TOKYO2185

International Classification(s)

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  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hori, Ryoichi Tokyo, JP 92 1509
Horiguchi, Masashi Koganei, JP 191 2439
Kajigaya, Kazuhiko Tokyo, JP 265 1308
Kubo, Masaharu Hachioji, JP 52 858
Matsumoto, Tetsuro Higashiyamato, JP 47 752
Nakagome, Yoshinobu Hachioji, JP 106 2055

Cited Art

Patent Info (Count) # Cites Year
 
FUJITSU LIMITED (1)
4,965,768 Semiconductor device having programmable read only memory cells for specific mode 6 1987
 
LATTICE SEMICONDUCTOR CORPORATION (1)
5,212,652 Programmable gate array with improved interconnect structure 82 1989
 
MITSUBISHI DENKI KABUSHIKI KAISHA (1)
5,249,155 Semiconductor device incorporating internal voltage down converting circuit 54 1992
 
XILINX, INC. (1)
5,343,406 Distributed memory architecture for a configurable logic array and method for using distributed memory 235 1989

Patent Citation Ranking

Forward Cites

Patent Info (Count) # Cites Year
 
TANISYS TECHNOLOGY, INC. (4)
6,182,253 Method and system for automatic synchronous memory identification 18 1997
5,995,424 Synchronous memory test system 76 1997
5,812,472 Nested loop method of identifying synchronous memories 25 1997
5,914,902 Synchronous memory tester 76 1998
 
ACTEL CORPORATION (3)
5,959,466 Field programmable gate array with mask programmed input and output buffers 24 1997
6,150,837 Enhanced field programmable gate array 146 1997
6,362,649 Field programmable gate array with mask programmed input and output buffers 14 1999
 
SAMSUNG ELECTRONICS CO., LTD. (3)
5,771,198 Source voltage generating circuit in semiconductor memory 2 1996
5,929,691 Mode setting circuit for a memory device 29 1997
6,067,649 Method and apparatus for a low power self test of a memory subsystem 61 1998
 
XILINX, INC. (2)
6,359,248 Method for marking packaged integrated circuits 35 1999
6,674,036 Method for marking packaged integrated circuits 3 2001
 
HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. (1)
6,169,694 Circuit and method for fully on-chip wafer level burn-in test 10 1999
 
INVENTEC CORPORATION (1)
7,631,232 Parallel burning system and method 0 2007
 
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (1)
7,110,314 Semiconductor memory device and method for initializing the same 1 2003
 
MICRON TECHNOLOGY, INC. (1)
5,978,297 Method and apparatus for strobing antifuse circuits in a memory device 23 1998
 
MITSUBISHI DENKI KABUSHIKI KAISHA (1)
5,818,768 Operation mode setting circuit in semiconductor device 5 1996
 
PANASONIC CORPORATION (1)
7,148,503 Semiconductor device, function setting method thereof, and evaluation method thereof 1 2001
 
ROUND ROCK RESEARCH, LLC (1)
7,023,755 Low power control circuit and method for a memory device 0 2003
 
SONY COMPUTER ENTERTAINMENT INC. (1)
6,518,823 One-time programmable logic device 6 2000