Method for manufacturing a semiconductor device using a catalyst

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United States of America Patent

PATENT NO 5543352
SERIAL NO

08341935

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Abstract

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A method for manufacturing a thin film transistor having a crystalline silicon layer as an active layer comprises the steps of disposing a solution containing a catalyst for promoting a crystallization of silicon in contact with an amorphous silicon film, crystallizing the amorphous silicon at a relatively low temperature and then improving the crystallinity by irradiating the film with a laser light. The concentration of the catalyst in the crystallized silicon film can be controlled by controlling the concentration of the catalyst in the solution.

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Patent Owner(s)

Patent OwnerAddress
SHARP CORPORATIONOSAKA JAPAN
SEMICONDUCTOR ENERGY LABORATORY CO LTDKANAGAWA KANAGAWA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Miyanaga, Akiharu Kanagawa, JP 297 15670
Ohtani, Hisashi Kanagawa, JP 444 21462
Suzuki, Atsunori Kanagawa, JP 11 1211
Yamaguchi, Naoaki Kanagawa, JP 65 4105
Zhang, Hongyong Kanagawa, JP 462 30622

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