Apparatus and methods employing harmonic analysis for measuring the difference in phase between two coherent beams

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United States of America Patent

PATENT NO 5543914
SERIAL NO

08372226

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Abstract

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An improved interferometric measuring system that includes a system for measuring a phase difference between two coherent beams oscillating at substantially the same frequency, and including a phase modulator disposed into optical communication with one of the coherent beams and being adapted to generate a phase modulated beam signal. A beam combiner combines the phase modulated beam signal with the second one of the coherent beams to generate a combined beam signal. A detector element measures the intensity of the combined beam signal and a date processor analyzes the intensity to determine from the harmonic components of the combined beam signal the phase difference between the two coherent beams.

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Patent Owner(s)

Patent OwnerAddress
SPARTA INC24 HARTWELLL AVENUE LEXINGTON MA 02173 LEXINGTON MA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Henshaw, Philip D Carlisle, MA 12 243
Lis, Steven A Needham, MA 9 232

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