Optimization circuitry and control for a synchronous memory device with programmable latency period

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United States of America Patent

PATENT NO 5544124
SERIAL NO

08403382

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Abstract

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A method and apparatus for optimizing the speed path of a memory access operation in a synchronous depending upon the present latency period for the synchronous DRAM. The improved memory device compensates the time between row address latching and column address latching (tRCD) by delaying the presentment of the column address to compensate tRCD from the time available for column address latching to valid data-out (tAA) when tRCD is the critical parameter. Optimization circuitry reduces the amount of time available for tAA and 'shifts' it to the more critical parameter tRCD, enabling the optimization or reduction of the time allocated for tRCD by compensating tRCD with the extra time available for tAA. Thus, the memory access optimization circuitry enables an optimization or reduction in the total memory access time by compensating the optimized tRCD with the extra time available for tAA.

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Patent Owner(s)

  • ROUND ROCK RESEARCH, LLC

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Schaefer, Scott Boise, ID 58 1677
Zagar, Paul S Boise, ID 58 2394

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