Automated defect classification system
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United States of America Patent
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Aug 6, 1996
Grant Date -
N/A
app pub date -
Oct 22, 1993
filing date -
Oct 22, 1993
priority date (Note) -
Expired
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Abstract
An integrated visual defect detection and classification system. The invention includes adaptive defect detection and image labeling, defect feature measures, and a knowledge based inference shell/engine for classification based on fuzzy logic. The combination of these elements comprises a method and system for providing detection and analysis of product defects in many application domains, such as semiconductor and electronic packaging manufacturing.
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