Apparatus for and method of establishing a density profile through the thickness of a panel
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United States of America Patent
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Aug 20, 1996
Grant Date -
N/A
app pub date -
Aug 22, 1994
filing date -
Dec 22, 1992
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A measuring device (8) comprises an emitter (9) and a linear array (10) of detector elements (11 to 14). The emitter (9) emits a radiation beam (15) which enters into a narrow face (20) of a panel-like workpiece (7) at an angle (19). The individual rays (1 to 4) of the radiation beam (15) have different length paths (21 to 24) through the workpiece (7) and thus have differently attenuated output intensities. By difference calculations on the output intensities of the rays (1 to 4) thus obtained, one can calculate density values in the narrow face (20) and finally establish a density profile through the thickness (6) of the workpiece (7).
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