Importance

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Abstract

A test fixture (10) for mounting electrical circuit boards (CB, CB') and placing a plurality of test locations of the circuit board in electrical engagement with respective probe test pins (16) of an array of such pins has a cam mechanism (22) mounted in an integrally formed modular frame (20) of an upper assembly (12). The upper assembly (12) is pivotably mounted on a lower base assembly (14) and latched thereto by a latch assembly (28). A circuit board to be tested is placed over an array of longitudinally depressable pins (16), the upper assembly (28) pivoted to a closed position and latched by latch mechanism (28). Handle (22k) attached to the cam assembly (22) is then rotated causing blocks (22f) to slide in rectilinear track (22e) of slide plate (22c) while translating rotary motion of the cams members (22g) to a vertical motion of a pusher plate (30) attached to the slide plates (22c). The pusher plate (30), maintained in selected angular orientation by shafts (24), engages the circuit board (CB, CB') through pusher pins (30a) forcing downward movement of the circuit board against probe pins (16) depressing the probe pins (16) a selected distance.

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First Claim