Method for testing characteristics of a semiconductor memory device in a series of steps
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United States of America Patent
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Aug 27, 1996
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Nov 22, 1993
filing date -
Aug 7, 1991
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Abstract
Transfer data indicating a measurement status of a characteristics test of a semiconductor memory device is written into the semiconductor memory device itself in any one of a series of measurement steps. In the immediately following measurement step, the transfer data is read out, before performance of a characteristics test of this step, to judge the measurement status of the preceding measurement step. For example, the transfer data is data indicating that the characteristics test has been performed in the preceding step. Alternatively, it is classification data indicating a rank of the semiconductor memory device.
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