Circuit probe for measuring a differential circuit
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United States of America Patent
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Oct 1, 1996
Grant Date -
N/A
app pub date -
Jul 5, 1994
filing date -
Jul 5, 1994
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A circuit probe (300) is provided for measuring a differential circuit. The circuit probe (300) incorporates a novel transmission line (325) which is formed to propagate signals with substantially equal even-mode and odd-mode characteristic impedances. The circuit probe (300) further includes signal contacts (314, 316) and ground contacts (312, 318) coupled to signal conductors (334, 336) and ground conductors (332, 338), respectively, of the transmission line (325).
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