Three-dimensional measurement device and system
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United States of America Patent
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Oct 1, 1996
Issued Date -
N/A
app pub date -
Nov 8, 1994
filing date -
May 26, 1994
priority date (Note) -
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status (Latency Note)
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Abstract
A measurement device or system (11) for determining features of a three-dimensional object (20) from two-dimensional images includes a projector (27) for projecting a pattern (73) upon the object (20), at least one imager (17, 19) for obtaining multiple sets of image data of the illuminated object (20) and a processor (47) for obtaining a three-dimensional image (81) of the object (20) from the multiple sets of data.
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Cited Art Landscape
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