Process and apparatus for automatically characterising, optimising and checking a crack detection analysis method
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United States of America Patent
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Oct 8, 1996
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N/A
app pub date -
Sep 6, 1995
filing date -
Oct 20, 1993
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Abstract
An apparatus for characterizing an analysis method based on fluorescent crack detection. The surface defects in articles to be checked are revealed by using a visible radiation around an excitation wavelength. The apparatus includes an illumination device, a camera and an image processor. The illumination device includes an ultraviolet light source, a monochromator and a light guide to focus the ultraviolet radiation.
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