Importance

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Abstract

A free running relaxation oscillator is disposed on a semiconductor integrated circuit die for generating a frequency representative of the natural frequency of the die. The natural frequency of the die changes for different operating temperatures and voltages. An optimal speed may be determined at which the die will reliably operate by measuring the natural frequency. The die may be effectively graded and matched with a similar die by correlating the natural frequency of the die with the temperature and voltage values at which the natural frequency was measured for each die. A plurality of integrated circuit dice may be connected into a digital system, and the natural frequencies of each die may be monitored so as to optimize the system operating speed, reduce system power consumption without degrading performance, and/or increase the operating speed of a slower die by changing the temperature and/or operating voltage thereof.

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First Claim