Method of manufacturing multiple polysilicon TFTs with varying degrees of crystallinity

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United States of America Patent

PATENT NO 5569610
SERIAL NO

08207185

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Abstract

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Method of fabricating a semiconductor circuit is initiated with formation of an amorphous silicon film. Then, a second layer containing at least one catalytic element is so formed as to be in intimate contact with the amorphous silicon film, or the catalytic element is introduced into the amorphous silicon film. This amorphous silicon film is selectively irradiated with laser light or other equivalent intense light to crystallize the amorphous silicon film.

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Patent Owner(s)

Patent OwnerAddress
SEMICONDUCTOR ENERGY LABORATORY CO LTDKANAGAWA-KEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Takayama, Toru Kanagawa, JP 534 28168
Takemura, Yasuhiko Kanagawa, JP 582 31804
Zhang, Hongyong Kanagawa, JP 462 30622

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