Spring probe BGA (ball grid array) contactor with device stop and method therefor

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United States of America Patent

PATENT NO 5570033
SERIAL NO

08504944

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Abstract

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The present invention relates to a spring probe contactor for testing BGA devices. The spring probe contactor is comprised of a plurality of spring probes for providing a connection between a BGA device to be tested and a DUT board. The plurality of spring probes are held within a contactor block having a plurality of apertures therethrough. The apertures are wide enough to hold a single spring probe within the contactor block without the spring probe coming into contact with the contactor block. A retaining plate is coupled to the contactor block for holding the plurality of spring probes within the contactor block. The retaining plate has a raised portion thereon which limits the compression of the plurality of spring probes when a BGA device is placed in the spring probe contactor.

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Patent Owner(s)

Patent OwnerAddress
SEONG CAPITAL LTD LIMITED LIABILITY COMPANY2711 CENTERVILLE RD SUITE 400 WILMINGTON DE 19808

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Staab, Craig C Mesa, AZ 5 69

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