Method for autonomous determination of tie points in imagery

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 5577181
SERIAL NO

08478972

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A method for selecting tie point locations within a series of overlapping images. Initially the series of images are ordered to maximize the potential for successful phase correlations between adjacent images. Adjacent pairs in the ordered images are then phase correlated to determine the translational offsets between adjacent pairs. The overlapping regions in adjacent pairs are assessed for normalized cross correlation and initial candidate tie points are selected within the regions at a reduced resolution. The initially selected tie points are then phase correlated at full resolution and any surviving candidate tie point locations are further refined to sub-pixel accuracy.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
RAYTHEON COMPANY A CORP OF DELAWARELEGAL DEPARTMENT M/S 1-1 141 SPRING STRRET LEXINGTON MA 02421

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bowden, Ronald L Parker, TX 1 12
Givens, Fenton L Dallas, TX 4 122

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation