Temperature controlling device for mask and wafer holders

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United States of America Patent

PATENT NO 5577552
SERIAL NO

08412101

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Abstract

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A temperature controlling device suitably usable in a semiconductor microcircuit manufacturing exposure apparatus exposes a semiconductor wafer to a mask to print a pattern of the mask on the wafer. The device includes a constant-temperature liquid medium supplying system for controlling temperature of a liquid at high precision, a distributing system for distributing the supplied liquid medium into plural flow passages, to supply the liquid medium to plural subjects of control such as, for example, a mask stage, a wafer stage and the like. The device further includes a plurality of temperature controls each being provided in corresponding one of the flow passages, for correction of any variance in temperature of the distributed liquid medium, resulting from pressure loss energies in the respective flow passages. Thus, temperatures of plural subjects of control can be controlled efficiently and with a simple structure.

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Patent Owner(s)

Patent OwnerAddress
CANON KABUSHIKI KAISHATOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ebinuma, Ryuichi Kawasaki, JP 74 1976
Kariya, Takao Hino, JP 35 867
Mizusawa, Nobutoshi Yamato, JP 43 1243
Sakamoto, Eiji Sagamihara, JP 60 916
Uda, Koji Yokohama, JP 17 502
Uzawa, Shunichi Tokyo, JP 63 1181

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