Apparatus and method for emulating a microelectronic device by interconnecting and running test vectors on physically implemented functional modules

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United States of America Patent

PATENT NO 5581742
SERIAL NO

08352680

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Abstract

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A simulation system for a microelectronic device having two or more functional modules from a megacell library, the simulation system utilizing actual physically implemented versions of each functional module (or block) from the megacell library so as to provide a more accurate and much faster simulation than a comparable software- or field programmable gate array-based simulation. The simulation system comprises means for providing a physically-based implementation of each functional module of a proposed design for a microelectronic device, the physically-based implementation being disposed on one or more test microelectronic devices used by the simulation system. Interconnecting means is used for electrically coupling together each of the physically-based implemented functional modules so as to produce the proposed design of the proposed microelectronic device. Emulation is performed by applying one or more test vectors at a preselected clock speed of the proposed design using the physically-based functional modules electrically coupled together to produce the proposed design, wherein the test vectors can be completed much faster as compared to a comparable software- or field programmable gate array-based simulation and wherein the results of the test vectors are much more accurate that the comparable simulations because the physically-based functional modules are used at a comparably lower cost.

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Patent Owner(s)

Patent OwnerAddress
SAMSUNG ELECTRONICS CO LTDGYEONGGI DO SOUTH KOREA GYEONGGI-DO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ho, Wai-Yan San Jose, CA 5 634
Lin, Chong M Sunnyvale, CA 12 308
Nguyen, Le Trong Monte Sereno, CA 85 3254

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