Method and system for weighing objects using X-rays
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United States of America Patent
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Dec 17, 1996
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app pub date -
Dec 23, 1993
filing date -
Dec 23, 1993
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Abstract
A method and system for weighing an object as it is carried on a conveyor past an x-ray source. X-rays from the x-ray source pass through the object, are attenuated in proportion to the mass of the object through which they pass, and impinge upon an x-ray detector array. X-ray detector array includes a layer of scintillating material that produces light in response to the intensity of the x-rays and a plurality of photodiodes to detect the light. The intensity of the x-rays received at the x-ray detector array is indicated by signals produced by the photodiodes, which are periodically scanned by a processor. The photodiode signals are each converted to a value representing the average areal density for a volume element extending above the photodiode into the object. Using the average areal density for each volume element and the size of each volume element, the processor determines the mass of the volume element. The entire object is advanced, and the mass of the volume elements in the object are generated and stored. The total mass of an object is determined by summing the masses of the volume elements, and a mass map of an object is generated that represents the location and mass of all of the volume elements in the object.
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- 15 United States
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Patent Owner(s)
- JOHN BEAN TECHNOLOGIES CORPORATION
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- [Patents Count]
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
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Vogeley, Jr Arthur W | Bellevue, WA | 3 | 160 |
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Fee | Large entity fee | small entity fee | micro entity fee | due date |
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Fee | Large entity fee | small entity fee | micro entity fee |
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Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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