Allelic ladders for short tandem repeat loci
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United States of America Patent
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Feb 4, 1997
Grant Date -
N/A
app pub date -
Mar 28, 1994
filing date -
Mar 28, 1994
priority date (Note) -
Expired
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Abstract
The present invention is directed to an assay system, a kit and a process for detecting at least one short tandem repeat sequence from DNA at a specific locus utilizing an allelic ladder containing at least two short tandem repeat sequences of the same lengths as two or more known alleles for the locus.
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