Importance

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Abstract

A connector, for use with an automatic test system for testing integrated circuit boards, consists of a non-conductive carrier that supports a plurality of electrically conductive contacts. In a preferred embodiment, the carrier includes a plurality of holes, each of which is filled with a wire mesh. The wire mesh compresses as necessary to accommodate variations in the lengths of the leads of the device-under-test or the wires of a system component, such as the system fixture. In an alternative embodiment, a flexible carrier supports a plurality of wires. The wires may be embedded in the carrier, or they may be wrapped partially around the carrier, to electrically connect leads proximate to top of the carrier with leads or contacts proximate to the bottom of the carrier. In a second alternative embodiment, the connector consists of a plurality of conductive drops, that are strategically placed on the ends of wires, leads or contacts. The drops are applied to the leads, wire and contacts in a semi-fluid state and they then harden. The drops are preferably made of a material such as a conductive polymer or a conductive silicon rubber, which remains somewhat elastic after it hardens. The drops may be supported by a carrier, instead of applied directly to the leads, wires or contacts.

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First Claim