Method of finding a critical path in a circuit by considering the clock skew

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United States of America Patent

PATENT NO 5608645
SERIAL NO

08214482

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Abstract

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The present invention is directed to a method of designing and fabricating a circuit layout which revolutionizes the manner by which critical weights of a circuit layout are assessed. In accordance with exemplary embodiments, a critical path is assessed on the basis of both a physical delay associated with a data propagation path and with respect to any clock skew which exists with respect to the data propagation path. A critical path can be a path having the shortest physical length from an input node to an output node if the clock skew along this path results in a high probability of a race condition. In accordance with exemplary embodiments, clock skew is assessed by determining the time differential between the arrival of a clock signal at a given data source instance and the arrival of a clock signal at a given data destination instance.

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Patent Owner(s)

Patent OwnerAddress
VLSI TECHNOLOGY INC1109 MCKAY DRIVE SAN JOSE CA 95131

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Spyrou, Athanasius W San Jose, CA 7 167

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