Boundary-scan bypass circuit for integrated circuit electronic component and circuit boards incorporating such circuits and components
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United States of America Patent
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Mar 25, 1997
Grant Date -
N/A
app pub date -
Dec 1, 1994
filing date -
Dec 1, 1994
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A method and apparatus for bypassing a boundary-scan cell during functional operation of an electronic component provides a component output signal (such as a data signal) to a boundary-scan bypass circuit during normal functional operation of the electronic component. The component output signal is multiplexed in the bypass circuit with the test result signal that occurs during boundary-scan testing. During functional operation of the electronic component, the component output signal is selected and provided to an output latch that is clocked by a transition of the clock signal of the electronic component. By bypassing the component output signal around the boundary-scan cell during normal operation, the traversing of the multiplexer by the component output signal after the transition of the clock signal of the component is avoided, thereby reducing off-chip delay.
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