Method and apparatus for visualizing assembled sewing patterns

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United States of America Patent

PATENT NO 5615318
SERIAL NO

08007284

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Waist and chest lengths of sewing patterns in an assembled state are handled as shape features of the sewing pattern. The shape of a reference dummy (dress form) is expanded and changed in form so that the waist and chest lengths of the reference dummy after expansion agree with the waist and chest lengths of the shape formed by assembling the sewing patterns. Calculation of the expansion processing is conducted by a central processing unit (CPU). The shape data of the reference dummy associated with the calculation is read from a floppy disk (FD) by means of an floppy disk drive (FDD).

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Patent Owner(s)

  • ASAHI KASEI KABUSHIKI KAISHA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Matsuura, Susumu Tokyo, JP 6 122

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