Manufacturing method of semiconductor device comprising BiCMOS transistor

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United States of America Patent

PATENT NO 5620908
SERIAL NO

08530578

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Abstract

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A method of manufacturing a semiconductor device including selectively forming an element-isolating insulating layer on a surface of a semiconductor substrate to define active regions; forming a first insulating layer and removing respective portions thereof on surfaces of a second conductive type active region and a first active region of a first conductive type; oxidizing to form a gate oxide layer; forming and patterning a conductive layer to form a gate electrodes of MOS transistors and a base-extracting electrode of a bipolar transistor; forming an opening, in the base-extracting electrode, and a side wall insulating layer on an inner wall of the opening; removing first and second portions of the insulating layer to form an overhung portion; epitaxially growing a second conductive type semiconductor layer using the base-extracting electrode and active region of the first conductive type as a seed crystal; and selectively forming a first conductive type semiconductor layer that is to become an emitter that does not contact the base-extracting electrode.

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Patent Owner(s)

Patent OwnerAddress
KABUSHIKI KAISHA TOSHIBA72-34 HORIKAWA-CHO SAIWAI-KU KAWASAKI-SHI KANAGAWA 2120013 ?2120013

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Inoh, Kazumi Yokohama, JP 14 389
Katsumata, Yasuhiro Chigasaki, JP 36 275
Matsuda, Satoshi Yokohama, JP 94 871
Yoshino, Chihiro Yokohama, JP 5 77

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