Protraction device for a measuring microscope
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United States of America Patent
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-
Apr 15, 1997
Grant Date -
N/A
app pub date -
Oct 4, 1995
filing date -
Oct 4, 1995
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A protraction device for a measuring microscope comprises a reticle aligned on an optical path of the microscope at an intermediate image plane thereof and adapted for rotation about a central axis, and an angle encoder operably coupled to the reticle such that when the angle encoder is rotated about its rotational axis, a corresponding rotation is produced in the reticle. The angle encoder provides a signal representative of an angular displacement of the reticle which is delivered to a printer, digital display, or the like.
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