US Patent No: 5,623,620

Number of patents in Portfolio can not be more than 2000

Special test modes for a page buffer shared resource in a memory device

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Abstract

A flash memory device having a page buffer circuit with special testing modes. The page buffer circuit comprises a plane A and a plane B, each comprising a static random access memory array. The page buffer circuit further comprises a mode control circuit that maps the plane A and the plane B as a contiguous extended memory space accessible over a host bus. The page buffer circuit also maps the plane A and the plane B as a control store for a flash array controller of the flash memory device.

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First Claim

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Patent Owner(s)

Patent OwnerAddressTotal Patents
INTEL CORPORATIONSANTA CLARA, CA24136

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Alexis, Ranjeet Folsom, CA 10 134
Fandrich, Mickey L Placerville, CA 39 1478
Fedel, Salim B Folsom, CA 4 131
Rashid, Mamun Fairfield, CA 10 481

Cited Art

Patent Info (Count) # Cites Year
 
INTEL CORPORATION (14)
5,053,990 Program/erase selection for flash memory 245 1988
5,065,364 Apparatus for providing block erasing in a flash EPROM 163 1989
5,159,672 Burst EPROM architecture 14 1989
5,177,745 Memory device with a test mode 40 1990
5,222,046 Processor controlled command port architecture for flash memory 106 1990
5,233,559 Row redundancy for flash memories 51 1991
5,249,158 Flash memory blocking architecture 43 1991
5,355,464 Circuitry and method for suspending the automated erasure of a non-volatile semiconductor memory 74 1991
5,265,059 Circuitry and method for discharging a drain of a cell of a non-volatile semiconductor memory 33 1991
5,245,572 Floating gate nonvolatile memory with reading while writing capability 134 1991
5,224,070 Apparatus for determining the conditions of programming circuitry used with flash EEPROM memory 76 1991
5,353,256 Block specific status information in a memory device 114 1993
5,377,199 Boundary test scheme for an intelligent device 21 1993
5,369,754 Block specific status information in a memory device 75 1994
 
AT&T INFORMATION SYSTEMS INC. (1)
5,155,833 Multi-purpose cache memory selectively addressable either as a boot memory or as a cache memory 33 1987
 
SAMSUNG ELECTRONICS CO., LTD. (1)
5,299,162 Nonvolatile semiconductor memory device and an optimizing programming method thereof 115 1992
 
SPANSION LLC (1)
5,126,808 Flash EEPROM array with paged erase architecture 190 1989

Patent Citation Ranking

Forward Cites

Patent Info (Count) # Cites Year
 
ATMEL CORPORATION (1)
7,646,645 Method and apparatus for testing the functionality of a page decoder 0 2007
 
DELL USA, L.P. (1)
6,357,018 Method and apparatus for determining continuity and integrity of a RAMBUS channel in a computer system 50 1999
 
HITACHI, LTD. (1)
6,324,634 Methods for operating logical cache memory storing logical and physical address information 8 2000
 
INTEL CORPORATION (1)
5,835,927 Special test modes for a page buffer shared resource in a memory device 10 1996
 
SAMSUNG ELECTRONICS CO., LTD. (1)
7,451,366 Nonvolatile memory devices with test data buffers and methods for testing same 1 2004
 
SHARP KABUSHIKI KAISHA (1)
7,405,974 Semiconductor memory device, page buffer resource assigning method and circuit therefor, computer system and mobile electronic device 28 2004
 
STMICROELECTRONICS PVT. LTD. (1)
6,052,806 Method and apparatus for testing an integrated circuit device 14 1995