High resolution differential spectrometry system

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United States of America Patent

PATENT NO 5624709
SERIAL NO

08480223

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A differential spectrometry system detects very narrow-band spectral features, while providing much higher optical transmittance and signal-to-noise ratios than prior optical-filter-based spectrometer systems. A plurality of light detectors (10a, 10b) detect light that falls within respective wide wavebands. The wide wavebands have overlapping and non-overlapping portions, one of which is the desired narrow waveband. The detector outputs are operated upon to produce an output signal (22) which includes substantially only the desired narrow waveband. In the preferred embodiment, the light detectors (10a, 10b) are implemented with a pair of optical detectors (30a, 30b) and respective optical interference filters (24a, 24b). The filters have substantially identical cut-off wavelengths (.lambda..sub.2) and cut-on wavelengths that are shifted by .DELTA..lambda. with respect to each other (.lambda..sub.1 and (.lambda..sub.1 +.DELTA..lambda.), respectively). The detector outputs are differenced with an operational amplifier (33), so that detector signals resulting from spectral features common to both detectors (30a, 30b) are canceled. The remaining signal (36) varies according to the amount of light that falls between wavelength boundaries [.lambda..sub.1 and (.lambda..sub.1 +.DELTA..lambda.)]. A preferred method of fabricating the optical interference filters (24a, 24b) is also provided.

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Patent Owner(s)

Patent OwnerAddress
OL SECURITY LIMITED LIABILITY COMPANY160 GREENTREE DRIVE SUITE 101 DOVER DE 19904

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Peterson, Cathy M Santa Barbara, CA 3 57
Stannard, John E Santa Barbara, CA 3 26
Walter, Geoffrey A Santa Ynez, CA 4 89
West, Roger A Ventura, CA 8 230

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