Testing device for testing electrical or electronic test specimens
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United States of America Patent
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Apr 29, 1997
Grant Date -
N/A
app pub date -
Dec 26, 1991
filing date -
Apr 26, 1989
priority date (Note) -
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status (Latency Note)
Importance
Abstract
A testing device for a printed circuit includes a plate which is at least partly constituted by semiconducting material, and sensing elements for the transmission of testing signals between the testing device and the printed circuit. The sensing elements may be in the form of projections or coils integral with the plate or in the form of pins receivable in recesses of the plate. The printed circuit has pads for the transfer of testing signals between the circuit and the testing device, and the sensing elements are so densely packed that at least two sensing elements cooperate with each pad.
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