Method and instrument for detection of change of thickness or refractive index for a thin film substrate

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May 20, 1997
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May 31, 1995
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Jul 31, 1992

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Abstract

An instrument configured and arranged to detect a change in thickness or refractive index of a thin film substrate. A method for optimizing the instrument and a method for detecting a change in thickness or refractive index of a thin film substrate.

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Patent Owner(s)

Patent Owner	Address
INVERNESS MEDICAL - BIOSTAR INC	51 SAWYER RD SUITE 200 WALTHAM MA 02453

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G01N:INVESTIGATING OR ANALYSING MATERIALS BY DETERMININ....

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Inventor Name	Address	# of filed Patents	Total Citations
Maul, Diana M	Thornton, CO	8	1049
Sandstrom, Torbjorn	Molnlycke, SE	95	2672
Stiblert, Lars	G oteborg, SE	12	467

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Method and instrument for detection of change of thickness or refractive index for a thin film substrate

Number of patents in Portfolio can not be more than 2000

United States of America Patent

08455493

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PATENT NO	5631171
SERIAL NO	08455493
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08455493

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