Infrared receiver wafer level probe testing
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United States of America Patent
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May 20, 1997
Grant Date -
N/A
app pub date -
Apr 3, 1996
filing date -
Apr 3, 1996
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A system for functionally testing opto-electronic devices, such as fiber-optic infrared receiver photodiodes, in the integral wafer or other optical port-exposed status. The testing arrangement uses a portable optical probe for communicating optical signals between the testing apparatus and the tested device in coincidence with electrical energization and functional operation of the electro-optical device by the test apparatus. The optical probe signals may be correlated in time relationship or other manner with the electrical signals applied-to the device-under-test. The invention provides simple conversion between a conventional electrical semiconductor device probe station and an electro-optical device probe station.
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