Elliptical laser probe for shadow mask
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United States of America Patent
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-
Jun 3, 1997
Grant Date -
N/A
app pub date -
Jul 21, 1995
filing date -
Jul 21, 1995
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A laser probe for measuring apertures in a sheet of material has a laser beam and a detection system. The laser beam has a major axis and a minor axis which are orthogonal to each other. The major axis is much larger than the minor axis. The dimensions of the apertures are determined from the fraction of the laser beam which passes through the sheet of material. Slot widths are measured by identifying relatively constant amounts of light passing through the sheet as the sheet moves relative to the laser beam.
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