Methods for optimizing of an optical assay device
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United States of America Patent
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Jun 17, 1997
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N/A
app pub date -
Mar 28, 1995
filing date -
Sep 18, 1989
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Abstract
Method for optimizing an optical assay device for an analyte, including the steps of: providing a substrate having a chosen thickness of an optically active layer thereon; providing an attachment layer of a chosen thickness on the optical coating; providing a receptive layer of a chosen thickness for the analyte, wherein at least one of the thicknesses of the optically active layer, attachment layer and receptive layer is varied to provide a plurality of thicknesses of that layer; contacting analyte with the receptive layer under conditions in which an increase in mass on the receptive layer results; and determining the optical thickness of the layer.
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