Method and apparatus for interim in-situ testing of an electronic system with an inchoate ASIC

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United States of America Patent

PATENT NO 5640337
SERIAL NO

08696141

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A technique is described for testing the performance of a target electronic system ultimately employing an ASIC comprising a core cell and surrounding logic, using an inchoate (designed, but not yet fabricated) ASIC on an interim basis. In one embodiment, a Q-part, or qualification part, which is essentially a bond-out of the core cell, is used in conjunction with programmable logic devices configured to perform the function of the surrounding logic. The Q-part and programmable logic are interconnected on a pod, and plugged into an interim version of a target electronic system. In another embodiment, the Q-part is software-simulated and interconnected on the pod to programmable logic devices. The programmable logic devices may be programmed either on-pod or off-pod, and signals incident to the operation of the pod plugged into the interim electronic system can be monitored and controlled.

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Patent Owner(s)

  • BELL SEMICONDUCTOR, LLC;LSI LOGIC CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Gluss, David Woodside, CA 5 405
Huang, Jen-Hsun San Jose, CA 39 551
Rostoker, Michael D San Jose, CA 204 14270

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