Method and apparatus for fastener hole inspection with a capacitive probe
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United States of America Patent
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-
Jul 8, 1997
Grant Date -
N/A
app pub date -
Jun 13, 1995
filing date -
Jun 13, 1995
priority date (Note) -
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status (Latency Note)
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Abstract
A computer-based method and apparatus for fastener hole inspection including a capacitive probe with a plurality of sensor elements, means for grounding the faster hole, and an electronics unit electrically connected to the probe for sequencially charging one of the plurality of sensor elements while applying a guard potential to the remaining sensor elements and adjacent electrical components to eliminate residual capactitances. A profile of the fastener hole is generated by evaluating, through a series resistor, the discharge waveforms of the plurality of sensor elements by converting the capacitance measurements obtained to distance measurements. A centering algorithm is employed to compensate for malalignment of the capacitive probe in the fastener hole.
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