Method of measuring the thickness of a transparent material
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United States of America Patent
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Aug 12, 1997
Grant Date -
N/A
app pub date -
Dec 15, 1995
filing date -
Feb 18, 1994
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method and apparatus for measuring the thickness of a transparent material. A light beam from a laser diode has a modulated optical frequency. The emitted light shines on opposite surfaces of a wall of the material and is reflected from both of the surfaces. The two beams are used to form an interference. The difference of step .delta. of the interference signal is then determined. The thickness of the transparent material is determined from this difference of step. The apparatus may be used with bottles of glass or plastic material, whether clear or colored and on flat glass.
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