Single-chip microprocessor with built-in self-testing function
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United States of America Patent
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Aug 12, 1997
Grant Date -
N/A
app pub date -
Jun 15, 1995
filing date -
Nov 15, 1994
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A single-chip microprocessor with a self-testing function for quickly detecting internal errors or defects while mounted to a circuit board without adversely affecting any external electronic devices connected thereto. A single-chip microprocessor comprising a built-in self-testing function for testing the internal circuitry thereof comprises a test mode signal output means for outputting the test mode signal when in the test mode, which is a mode for self-diagnostic testing of the internal circuitry; and an external output holding means disposed to the external output means for outputting signals from an external output terminal, and holding the output signal status of the external output terminal while the test mode signal is input from the test mode signal output means; and testing the internal circuitry of the single-chip microprocessor while holding the output signal status of the external output terminal.
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