Method and systems for obtaining higher order gradiometer measurements with lower order gradiometers

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United States of America Patent

PATENT NO 5657756
SERIAL NO

08476290

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Abstract

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A method and system of obtaining magnetic measurements with a preselected order of sensor gradiometer which are substantially equivalent to those which would be obtained with a sensor gradiometer of a higher order. The system and method employs a reference system comprising reference tensor gradiometers and appropriate components of a measured tensor are combined with the measurements obtained from the sensor gradiometer to obtain a magnetic measurement substantially equivalent to that which would have been measured by a higher order sensor gradiometer.

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Patent Owner(s)

Patent OwnerAddress
VSM MEDTECH SYSTEMS INC9 BURBIDGE STREET COQUITLAM BRITISH COLUMBIA V3K 7B2

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Haid, Gordon James Pitt Meadows, CA 1 67
Lee, Wai Meng Sixtus Coquitlam, CA 1 67
Taylor, Brent Ronald Coquitlam, CA 1 67
Tillotson, Mark Alan Maple Ridge, CA 1 67
Vrba, Jiri Port Coquitlam, CA 5 121

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